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SPIE Proceedings [SPIE Optical/Laser Microlithography IV - San Jose, United States (Wednesday 6 March 1991)] Optical/Laser Microlithography IV - Investigation of self-aligned phase-shifting reticles by simulation techniques
Noelscher, Christoph, Mader, Leonhard, Pol, VictorVolume:
1463
Year:
1991
Language:
english
DOI:
10.1117/12.44798
File:
PDF, 944 KB
english, 1991