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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Optical Manufacturing and Testing IV - Modeling of tool shape evolution in conformal (raster) grinding
Thonggoom, Rattaporn, Funkenbusch, Paul D., Gracewski, Sheryl M., Ruckman, Jeffrey L., Stahl, H. PhilipVolume:
4451
Year:
2001
Language:
english
DOI:
10.1117/12.453613
File:
PDF, 242 KB
english, 2001