![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Integrated Optoelectronics Devices - San Jose, CA (Saturday 25 January 2003)] Integrated Optics: Devices, Materials, and Technologies VII - Optical measurement of asymmetric structures: monitoring of organically doped film properties during Corona poling
Horowitz, Flavio, Pereira, Marcelo B., Correia, Ricardo B., Grieneisen, Hans-Peter H., Sidorin, Yakov S., Tervonen, AriVolume:
4987
Year:
2003
Language:
english
DOI:
10.1117/12.474360
File:
PDF, 153 KB
english, 2003