SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa Clara, CA (Monday 20 January 2003)] Computational Imaging - Use of secondary equivalent sources for solving electrical resistance inverse problems
Miled, Mohamed K. Ben Hadj, Miller, Eric L., Bouman, Charles A., Stevenson, Robert L.Volume:
5016
Year:
2003
Language:
english
DOI:
10.1117/12.488618
File:
PDF, 285 KB
english, 2003