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SPIE Proceedings [SPIE Fifth International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 24 October 2003)] Fifth International Symposium on Instrumentation and Control Technology - Shape measurement of BGA for analysis of defects by x-ray imaging
Sumimoto, Tetsuhiro, Maruyama, T., Azuma, Yoshiharu, Goto, Sachiko, Mondou, M., Furukawa, N., Okada, Saburo, Zhang, Guangjun, Zhao, Huijie, Wang, ZhongyuVolume:
5253
Year:
2003
Language:
english
DOI:
10.1117/12.521903
File:
PDF, 283 KB
english, 2003