![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 12 April 2004)] Polarization: Measurement, Analysis, and Remote Sensing VI - Scattering and emission polarization simulation for simple objects
An, Changhyuk, Goldstein, Dennis H., Chenault, David B., Zeringue, Kyle J.Volume:
5432
Year:
2004
Language:
english
DOI:
10.1117/12.543492
File:
PDF, 174 KB
english, 2004