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SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Non/destructive testing (NDT) and vibration analysis of defects in components and structures using laser diode shearography
Steinchen, Wolfgang, Osten, Wolfgang, Takeda, Mitsuo, Gan, Ymin, Kupfer, Gerhard, Mackel, PeterVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.545906
File:
PDF, 1.06 MB
english, 2004