![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 26 April 2004)] Optical Metrology in Production Engineering - Two-wavelength contouring in difference holographic interferometry and DISCO
Gyimesi, Ferenc, Osten, Wolfgang, Takeda, Mitsuo, Fuzessy, Zoltan, Raczkevi, Bela, Borbely, VencelVolume:
5457
Year:
2004
Language:
english
DOI:
10.1117/12.546053
File:
PDF, 378 KB
english, 2004