![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advances in Optical Data Storage Technology - The reliability test of center-aperture-detection-type magnetically induced super-resolution magneto-optical disk
Suzuki, Yoshihisa, Xu, Duanyi, Schouhamer Immink, Kees A., Tanaka, Sayoko, Nakatani, Morio, Shono, Keiji, Sumi, Satoshi, Tanemura, SakaeVolume:
5643
Year:
2004
Language:
english
DOI:
10.1117/12.571733
File:
PDF, 236 KB
english, 2004