SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advanced Sensor Systems and Applications II - Laser metrology in the micro-arcsecond metrology testbed
An, Xin, Marx, David S., Goullioud, Renaud, Zhao, Feng, Rao, Yun-Jiang, Kwon, Osuk Y., Peng, Gang-DingVolume:
5634
Year:
2005
Language:
english
DOI:
10.1117/12.580030
File:
PDF, 784 KB
english, 2005