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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging: Technology and Applications 2007 - Beijing, China (Sunday 9 September 2007)] International Symposium on Photoelectronic Detection and Imaging 2007: Related Technologies and Applications - A computed tomographic imaging system for experimentation
Lu, Yanping, Wang, Jue, Liu, Fenglin, Yu, Honglin, Zhou, LiweiVolume:
6625
Year:
2008
Language:
english
DOI:
10.1117/12.791209
File:
PDF, 751 KB
english, 2008