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SPIE Proceedings [SPIE Photonics, Devices, and Systems IV - Prague, Czech Republic (Saturday 27 September 2008)] Photonics, Devices, and Systems IV - In situ measurement of humidity induced changes in the refractive index and thickness of polyethylene glycol thin films
Bilen, Bukem, Tománek, Pavel, Senderáková, Dagmar, Skarlatos, Yani, Aktas, Gulen, Hrabovský, Miroslav, Inci, M. Naci, Dispinar, Tugba, Kose, M. Merve, Sanyal, AmitavVolume:
7138
Year:
2008
Language:
english
DOI:
10.1117/12.818038
File:
PDF, 224 KB
english, 2008