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SPIE Proceedings [SPIE International Symposium on Photoelectronic Detection and Imaging 2009 - Beijing, China (Wednesday 17 June 2009)] International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Imaging Detectors and Applications - Relative state parameters from images: testing system, algorithms, and experiment results
Zhang, Kun, Du, Xiaoping, Zhao, Jiguang, Wang, Xiang-jun, Zhang, Guang-jun, Zeng, Dexian, Ai, Ke-congVolume:
7384
Year:
2009
Language:
english
DOI:
10.1117/12.835664
File:
PDF, 238 KB
english, 2009