SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - Front-based image edge detection
Zheng, Yibo, Yoshizawa, Toru, Wei, Ping, Zhang, Lei, Zhu, Yuehong, Zheng, Jesse, Jia, Liping, Kang, JunjianVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.837810
File:
PDF, 591 KB
english, 2009