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SPIE Proceedings [SPIE International Conference on Optical Instrumentation and Technology - Shanghai, China (Monday 19 October 2009)] 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology - MCP gated x-ray framing camera
Cai, Houzhi, Yoshizawa, Toru, Wei, Ping, Liu, Jinyuan, Niu, Lihong, Zheng, Jesse, Liao, Hua, Zhou, JunlanVolume:
7513
Year:
2009
Language:
english
DOI:
10.1117/12.838031
File:
PDF, 1.19 MB
english, 2009