SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optical Micro- and Nanometrology III - Statistical signatures of random media: application to selective cancellation of scattered light
Sorrentini, Jacques, Gorecki, Christophe, Asundi, Anand K., Zerrad, Myriam, Amra, Claude, Osten, WolfgangVolume:
7718
Year:
2010
Language:
english
DOI:
10.1117/12.854061
File:
PDF, 1.15 MB
english, 2010