SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Research on time-resolved terahertz spectroscopy
Deng, Yuqiang, Zhang, Yudong, Sasián, José, Sun, Qing, Liu, Feng, Xiang, Libin, To, Sandy, Wang, Changlei, Xing, QirongVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.863981
File:
PDF, 5.47 MB
english, 2010