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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Analysis of closed fringe patterns for aspheric surface measurement
Nie, Liang, Zhang, Yudong, Sasián, José, Liu, Baoyuan, Han, Jun, Xiang, Libin, Yu, Xun, To, SandyVolume:
7656
Year:
2010
Language:
english
DOI:
10.1117/12.866158
File:
PDF, 1.39 MB
english, 2010