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SPIE Proceedings [SPIE International Conference on Image Processing and Pattern Recognition in Industrial Engineering - Xi'an, China (Saturday 7 August 2010)] International Conference on Image Processing and Pattern Recognition in Industrial Engineering - An improved fusion of IHS based on wavelet for high resolution images
Feng, Yi, Du, Zhengyu, Liu, Bin, Wu, Beiping, Yue, YingchunVolume:
7820
Year:
2010
Language:
english
DOI:
10.1117/12.866756
File:
PDF, 776 KB
english, 2010