SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Optical characterization of phase gratings written by a UV femtosecond laser in PMMA
De Nicola, S., Lehmann, Peter H., Osten, Wolfgang, Abdalah, S., Al-Naimee, K., Gastinger, Kay, Geltrude, A., Locatelli, M., Meucci, R., Baum, A., Perrie, W., Scully, P. J., Taranu, A., Arecchi, F. T.Volume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.889429
File:
PDF, 1.49 MB
english, 2011
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