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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy V - The current status of reflector production and hard x-ray characterization for ASTRO-H/HXT
Miyazawa, Takuya, O'Dell, Stephen L., Pareschi, Giovanni, Furuzawa, Akihiro, Kanou, Yasufumi, Matsuda, Kenji, Sakai, Michito, Yamane, Nobuyuki, Kato, Hiroyoshi, Miyata, Yusuke, Sakanobe, Karin, Haba,Volume:
8147
Year:
2011
DOI:
10.1117/12.893155
File:
PDF, 5.07 MB
2011