SPIE Proceedings [SPIE SPIE Optical Metrology - Munich,...

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SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Front Matter: Volume 8082

SPIE, Proceedings of, Lehmann, Peter H., Osten, Wolfgang, Gastinger, Kay
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Volume:
8082
Year:
2011
Language:
english
DOI:
10.1117/12.898995
File:
PDF, 337 KB
english, 2011
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