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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, United States (Sunday 22 January 2012)] Digital Photography VIII - Reduced-reference image quality assessment based on statistics of edge patterns
Chen, Yuting, Battiato, Sebastiano, Rodricks, Brian G., Xue, Wufeng, Mou, Xuanqin, Sampat, Nitin, Imai, Francisco H., Xiao, FengVolume:
8299
Year:
2012
Language:
english
DOI:
10.1117/12.907973
File:
PDF, 713 KB
english, 2012