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SPIE Proceedings [SPIE 1983 International Techincal Conference/Europe - Geneva, Switzerland (Monday 18 April 1983)] Optical System Design, Analysis, and Production - Lens Defects And Their Effect On Thermal Imager Performance
Deans, Christopher D. P., Jennings, J. P., Lewis, Colin, McRae, Ian, Fischer, Robert E., Rogers, Philip J.Volume:
399
Year:
1983
Language:
english
DOI:
10.1117/12.935455
File:
PDF, 2.37 MB
english, 1983