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SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California, USA (Sunday 12 August 2012)] Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI - Metrology and instrumentation challenges with high-rate, roll-to-roll manufacturing of flexible electronic systems
Subbaraman, Harish, Lin, Xiaohui, Xu, Xiaochuan, Dodabalapur, Ananth, Guo, L. Jay, Chen, Ray T., Postek, Michael T., Coleman, Victoria A., Orji, Ndubuisi G.Volume:
8466
Year:
2012
Language:
english
DOI:
10.1117/12.940778
File:
PDF, 858 KB
english, 2012