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SPIE Proceedings [SPIE 13 Intl Conf on Infrared and Millimeter Waves - Honolulu, HI (Saturday 5 December 1987)] 13th Intl Conf on Infrared and Millimeter Waves - Determination Of I-V Characteristics Of Negative Conductance Devices From Microwave Reflection Coefficients
Huang, P., Botula, A., Luhmann, Jr., N. C., Pan, D. S., Temkin, Richard J.Volume:
1039
Year:
1988
Language:
english
DOI:
10.1117/12.978504
File:
PDF, 50 KB
english, 1988