Rapid Characterization of Thin Film Dissolution in Water...

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Rapid Characterization of Thin Film Dissolution in Water with in Situ Monitoring of Film Thickness Using Reflectometry

Yersak, Alexander S., Lewis, Ryan J., Tran, Jenny, Lee, Yung-Cheng
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Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.6b03606
Date:
June, 2016
File:
PDF, 9.73 MB
english, 2016
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