Rapid Characterization of Thin Film Dissolution in Water with in Situ Monitoring of Film Thickness Using Reflectometry
Yersak, Alexander S., Lewis, Ryan J., Tran, Jenny, Lee, Yung-ChengLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.6b03606
Date:
June, 2016
File:
PDF, 9.73 MB
english, 2016