[IEEE 2006 International SiGe Technology and Device Meeting...

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[IEEE 2006 International SiGe Technology and Device Meeting - Princeton, NJ, USA (15-17 May 2006)] 2006 International SiGe Technology and Device Meeting - Lateral Quantum Dot in Si/SiGe Realized by a Schottky Split-Gate Technique

Berer, T., Pachinger, D., Pillwein, G., Muhlberger, M., Lichtenberger, H., Brunthaler, G., Schaffler, F.
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Year:
2006
Language:
english
DOI:
10.1109/istdm.2006.1716032
File:
PDF, 1.76 MB
english, 2006
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