SPIE Proceedings [SPIE Analytical Methods for Optical Tomography - Zvenigorod, Russia (Monday 4 November 1991)] Analytical Methods for Optical Tomography - Infrared introscopy and microtomography of semiconductor structures
Aksenov, Leonid, Aristov, Vitaly V., Frolov, Konstantin, Rau, Edward I., Levin, Gennady G.Volume:
1843
Year:
1992
Language:
english
DOI:
10.1117/12.131902
File:
PDF, 597 KB
english, 1992