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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Multilayer and Grazing Incidence X-Ray/EUV Optics II - 15-30 arcsec resolution replica x-ray optics for AXAF-S
Stella, Luigi, Chincarini, Guido, Citterio, Oberto, Conconi, Paolo, Maccacaro, T., Tagliaferri, G., Trinchieri, G., Wolter, A., Bignami, Giovanni F., Bocchino, F., Maggio, A., Micela, G., Sciortino, SVolume:
2011
Year:
1994
Language:
english
DOI:
10.1117/12.167241
File:
PDF, 409 KB
english, 1994