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SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Machine Vision Applications in Industrial Inspection II - Phase-measuring methods for measurement of three-dimensional shapes in automated inspection of manufactured electronic assemblies
Pearson, Jeremy D., Lilley, Francis, Burton, David R., Atkinson, John T., Kshirsagar, Shirish P., Search, David J., Hobson, Clifford A., Dawson, Benjamin M., Wilson, Stephen S., Wu, Frederick Y.Volume:
2183
Year:
1994
Language:
english
DOI:
10.1117/12.171213
File:
PDF, 447 KB
english, 1994