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SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Machine Vision Applications in Industrial Inspection II - Bidirectional template matching for 3D CAD-based inspection
Newman, Timothy S., Jain, Anil K., Dawson, Benjamin M., Wilson, Stephen S., Wu, Frederick Y.Volume:
2183
Year:
1994
Language:
english
DOI:
10.1117/12.171215
File:
PDF, 361 KB
english, 1994