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SPIE Proceedings [SPIE IS&T/SPIE 1994 International Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 6 February 1994)] Nonlinear Image Processing V - Adaptive local thresholding algorithm that maximizes the contour features within the thresholded image
Weeks, Arthur R., Myler, Harley R., Apley, L. F., Dougherty, Edward R., Astola, Jaakko, Longbotham, Harold G.Volume:
2180
Year:
1994
Language:
english
DOI:
10.1117/12.172562
File:
PDF, 529 KB
english, 1994