SPIE Proceedings [SPIE Microelectronic Manufacturing - Austin, TX (Tuesday 18 October 1994)] Microelectronics Technology and Process Integration - New hot-carrier-resistant P-I-N MOSFET structure
Jung, Le-Tien, Manna, Indrajit, Bhattacharya, Swapan, Banerjee, Sanjay K., Chen, Fusen E., Murarka, Shyam P.Volume:
2335
Year:
1994
Language:
english
DOI:
10.1117/12.186061
File:
PDF, 263 KB
english, 1994