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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Cargo Inspection Technologies - MIMD computer system for cargo inspection
Paranjape, Raman B., Ho, Ivy, Novoselsky, Anguel, Feather, Thomas, Berkowitz, Stuart, Lawrence, Andre H.Volume:
2276
Year:
1994
Language:
english
DOI:
10.1117/12.189170
File:
PDF, 463 KB
english, 1994