SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] X-Ray and Extreme Ultraviolet Optics - Penning source for calibration of x-ray and EUV optics and spectrometers at wavelengths as short as 50 Å
Kellogg, Edwin M., Wargelin, Bradford J., Norton, Timothy J., Eng, Roger, Kolodziejczak, Jeffery J., Hoover, Richard B., Walker, Jr., Arthur B. C.Volume:
2515
Year:
1995
Language:
english
DOI:
10.1117/12.212607
File:
PDF, 160 KB
english, 1995