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SPIE Proceedings [SPIE SPIE Commercial + Scientific Sensing and Imaging - Baltimore, Maryland, United States (Sunday 17 April 2016)] Dimensional Optical Metrology and Inspection for Practical Applications V - Detailed analysis of an optimized FPP-based 3D imaging system

Harding, Kevin G., Zhang, Song, Tran, Dat, Thai, Anh, Duong, Kiet, Nguyen, Thanh, Nehmetallah, George
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Volume:
9868
Year:
2016
Language:
english
DOI:
10.1117/12.2220265
File:
PDF, 1.12 MB
english, 2016
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