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SPIE Proceedings [SPIE International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Kiev, Ukraine (Thursday 11 May 1995)] International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Photoreflectance characterization on GaAs/AlGaAs optical waveguides of multiple quantum-well structure
Jan, Gwo-Jen, Tai, Yu-Yuan, Hsu, Kuo-Tung, Svechnikov, Sergey V., Valakh, Mikhail Y.Volume:
2648
Year:
1995
Language:
english
DOI:
10.1117/12.226204
File:
PDF, 176 KB
english, 1995