SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Dynamic observation of surface charge distribution by electro-optic Pockels effect technique
Iizuka, Keiji, Zhu, Yongchang, Takada, Tatsuo, Yoshizawa, Toru, Yokota, HideshiVolume:
2873
Year:
1996
Language:
english
DOI:
10.1117/12.246260
File:
PDF, 298 KB
english, 1996