SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VIII - Arc-second source positions with a prototype BASIS imaging system
Palmer, David M., Parsons, Ann M., Kurczynski, Peter, Barbier, Louis M., Barthelmy, Scott D., Bartlett, Lyle M., Fenimore, Edward E., Gehrels, Neil A., Krizmanic, John F., Mancini, Derrick C., Stahle,Volume:
3114
Year:
1997
Language:
english
DOI:
10.1117/12.283784
File:
PDF, 641 KB
english, 1997