SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - Optical design of the INTEGRAL Optical Monitoring Camera
Mazy, Emmanuel, Defise, Jean-Marc, Plesseria, J.-Y., de Vos, Lieve, Gu, Zu-Han, Maradudin, Alexei A.Volume:
3426
Year:
1998
Language:
english
DOI:
10.1117/12.328465
File:
PDF, 539 KB
english, 1998