SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX - The Vernier electronic readout: high resolution and image stability from a charge division readout for microchannel plates
Lapington, Jonathan S., Sanderson, B. S., Worth, Liam B. C., Siegmund, Oswald H. W., Gummin, Mark A.Volume:
3445
Year:
1998
Language:
english
DOI:
10.1117/12.330316
File:
PDF, 1.13 MB
english, 1998