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SPIE Proceedings [SPIE Photonics East '99 - Boston, MA (Sunday 19 September 1999)] Sensors and Controls for Intelligent Machining and Manufacturing Mechatronics - Up-to-date metrology for effective quality assurance of machine production
Dudas, Illes, Knopf, George K., Muir, Patrick F., Orban, Peter E.Volume:
3832
Year:
1999
Language:
english
DOI:
10.1117/12.371166
File:
PDF, 581 KB
english, 1999