SPIE Proceedings [SPIE Optics and Optoelectronic Inspection...

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SPIE Proceedings [SPIE Optics and Optoelectronic Inspection and Control: Techniques, Applications, and Instruments - Beijing, China (Wednesday 8 November 2000)] Optical Measurement and Nondestructive Testing: Techniques and Applications - New application of integrating sphere

Wang, Jinjiang, Wang, Ye, Yang, Zhiwen, Song, FeiJun, Chen, Frank, Hung, Michael Y.Y., Shang, H.M.
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Volume:
4221
Year:
2000
Language:
english
DOI:
10.1117/12.402617
File:
PDF, 99 KB
english, 2000
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