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SPIE Proceedings [SPIE Fifth International Conference on Material Science and Material Properties for Infrared Optoelectronics - Kiev, Ukraine (Monday 22 May 2000)] Fifth International Conference on Material Science and Material Properties for Infrared Optoelectronics - Photoelectric characteristics of inhomogeneous MIS structures based in Si, HgCdTe
Voitsekhovskii, Aleksander V., Nesmelov, Sergey N., Koulchitskii, N. A., Sizov, Fiodor F.Volume:
4355
Year:
2001
Language:
english
DOI:
10.1117/12.417795
File:
PDF, 2.22 MB
english, 2001