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SPIE Proceedings [SPIE Electronic Imaging 2003 - Santa Clara, CA (Monday 20 January 2003)] Poly-Silicon Thin Film Transistor Technology and Applications in Displays and Other Novel Technology Areas - Property of single-crystalline Si TFTs fabricated with μ-Czochralski (grain filter) process
Ishihara, Ryoichi, van der Wilt, Paul C., van Dijk, Barry D., Metselaar, J. W., Beenakker, C. I. M., Voutsas, Apostolos T.Volume:
5004
Year:
2003
Language:
english
DOI:
10.1117/12.482582
File:
PDF, 828 KB
english, 2003