SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Recent Developments in Traceable Dimensional Measurements II - Traceability in metrology and uncertainty evaluation of a calibration system for GPS receivers
Lee, Chiung-Wu, Yeh, Ta-Kang, Peng, Gwo-Sheng, Decker, Jennifer E., Brown, NicholasVolume:
5190
Year:
2003
Language:
english
DOI:
10.1117/12.505610
File:
PDF, 420 KB
english, 2003