SPIE Proceedings [SPIE Optical Science and Technology,...

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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, CA (Sunday 3 August 2003)] Polarization Science and Remote Sensing - Active detection of off-diagonal Mueller elements of rough targets

Hoover, Brian G., Dayton, David C., Havey, Jason E., Gonglewski, John D., Gamiz, Victor L., Ulibarri, Laura J., Shaw, Joseph A., Tyo, J. Scott
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Volume:
5158
Year:
2003
Language:
english
DOI:
10.1117/12.507350
File:
PDF, 805 KB
english, 2003
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