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SPIE Proceedings [SPIE Fifth International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 24 October 2003)] Fifth International Symposium on Instrumentation and Control Technology - Study on microdisplacement measurement by laser interference and image processing methods
Zheng, Lei, Wang, Jia-dao, Kong, Xianmei, Chen, Da-rong, Liu, Zhongyou, Qian, Jin, Li, Yongjian, Zhang, Guangjun, Zhao, Huijie, Wang, ZhongyuVolume:
5253
Year:
2003
Language:
english
DOI:
10.1117/12.521907
File:
PDF, 224 KB
english, 2003