SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advanced Materials and Devices for Sensing and Imaging II - Precision analysis of scanning element in laser scanning and imaging system
Xu, Min, Hu, Jiasheng, Wu, Xu, Wang, Anbo, Zhang, Yimo, Ishii, YukihiroVolume:
5633
Year:
2005
Language:
english
DOI:
10.1117/12.569755
File:
PDF, 92 KB
english, 2005